–     System for scanning probe microscopy applications and method for obtaining said system: Inventors: Y. Huttel, L. Martínez Orellana. Patent nº: EP18382665.0. 14/09/2018. CSIC. –     Device and process for the stable manufacture of nanoclusters over time. Inventores: Inventors: Y. Huttel, L. Martínez Orellana, Iván Fernández Martínez. Patent nº: EP18382577.7. 31/07/2018. CSIC, Nano4Energy. –     Dispositivo y … Continue reading Patents